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Nanographs open beam interface scan generator, image capture system, patterning controller, and  lithography controller for scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM), and focused ion beams (FIB).

Introducing the
Open Beam Interface

Our home-grown open source hardware and software beam control solution.

Contact us for a quote on Open Beam Interface hardware, applications development for your use case, interface kits for your microscope, or onsite installation.

Material Analysis

Applications:

Engineering and Design

Field Support

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